"5 työpaikkailmoitus, jonka ala on Spektroskopia työnantajalta Advanced Research Center for Nanolithography ARCNL

Löydä avoimia työpaikkoja, joiden ala on Spektroskopia työnantajalta Advanced Research Center for Nanolithography ARCNL. Jos haluat saada tällaisista työpaikoista viestin niiden julkaisun yhteydessä, luo ilmainen Paikkavahti.

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Advanced Research Center for Nanolithography ARCNL
Amsterdam, Alankomaat

PhD: Imaging Spectroscopy for Broadband EUV Source Size Characterization

Work Activities This fully funded PhD position is part of a Holland High Tech (TKI HTSM) grant titled “Imaging Spectroscopy for Broadband EUV Source Size Characterization (ImSpec)”, a collaboration...

Julkaistu 1 viikko sitten
Closing in: 4 days
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Advanced Research Center for Nanolithography ARCNL
Amsterdam, Alankomaat

PhD: Imaging Spectroscopy for Broadband EUV Source Size Characterization

Work ActivitiesThis fully funded PhD position is part of a Holland High Tech (TKI HTSM) grant titled “Imaging Spectroscopy for Broadband EUV Source Size Characterization (ImSpec)”, a collaboration between the Advanced Research Center for Nanolitho...

Julkaistu 1 kuukausi sitten
Tohtorikoulutettava
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Advanced Research Center for Nanolithography ARCNL
Amsterdam, Alankomaat

PhD: Electron-induced damage mechanisms in SEM imaging

Work ActivitiesThe goal of the project is to learn more about the possible detrimental effects of electrons in scanning electron microscopy for metrology applications, on materials used in the semiconductor industry. As a PhD student you will use ...

Julkaistu 2 kuukautta sitten
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Advanced Research Center for Nanolithography ARCNL
Amsterdam, Alankomaat

Postdoc: electron-induced damage mechanisms in SEM imaging

Work ActivitiesThe goal of the project is to learn more about the possible detrimental effects of electrons in scanning electron microscopy for metrology applications, on materials used in the semiconductor industry. As a Postdoctoral Researcher y...

Julkaistu 2 kuukautta sitten
Tutkijatohtori
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Advanced Research Center for Nanolithography ARCNL
Amsterdam, Alankomaat

PhD: Terahertz and optical metrology of semiconductor material changes

Work ActivitiesIn semiconductor device manufacturing, metrology tools are required for wafer alignment, overlay and device inspection. As devices become more complicated and as stronger light sources are being used to get sufficient signal from sa...

Julkaistu 2 kuukautta sitten
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